Semiconductor
semiconductor Test Probe
| Part No. | Diameter | Max. Travel | Length | |
|---|---|---|---|---|
| SDE020260 | 0.20 | 0.6mm | 3.70 | Double-ended |
| SDE028400 | 0.28 | 1.0mm | 5.70 | Double-ended |
| SDE031400 | 0.31 | 1.0mm | 5.70 | Double-ended |
| SDE038400 | 0.38 | 1.0mm | 5.70 | Double-ended |
| SDE051240 | 0.51 | 0.8mm | 3.70 | Double-ended |
| SDE051400 | 0.51 | 0.8mm | 5.70 | Double-ended |
| SDE0891072 | 0.89 | 1.5mm | 10.70 | Double-ended |
| SE056230300J | 0.65 | 0.7mm | 3.00 | Single-ended |